Characterization of silver layers deposited by aluminum oxide, silicon dioxide, and blend for highly reflective optics
Characterization of silver layers deposited by aluminum oxide, silicon dioxide, and blend for highly reflective optics
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DOI：
10.1016/j.optmat.2024.115060
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发表时间：
2024-03
影响因子：
3.9
通讯作者：
Hsing-Yu Wu;Hong-Wei Chen;Shao-Rong Huang;Chih-Hsuan Shih;Guoyu Yu;Yung-Shin Sun;Jin-Cherng Hsu-Jin-Cherng-H
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作者：
Hsing-Yu Wu;Hong-Wei Chen;Shao-Rong Huang;Chih-Hsuan Shih;Guoyu Yu;Yung-Shin Sun;Jin-Cherng Hsu-Jin-Cherng-H
本研究探索了金属银涂层在光学望远镜中的应用。银膜在可见光到红外光谱范围内表现出高的反射率，并表现出良好的附着力。X射线光电子能谱(XPS)分析了银层上方和下方两个界面的结合特性。在银界面上确定的主要键是Ag-O、Ag-Si和Ag-Al_2O_3。Ag-O键的共价性对层间结合是至关重要的，因为它导致Ag3d XPS光谱中Ag0的高结合能漂移。增强的银多层膜保持了它们的反射率和附着力，对于恶劣环境下的空间光学来说是必不可少的。
This study explores the application of metallic silver coatings in optical telescopes. The silver film demonstrates high reflectance across the visible to the infrared spectral range and exhibits excellent adhesion properties. X-ray photoelectron spectroscopy (XPS) analyzes the bonding properties of the two interfaces above and below the silver layer. The main bonds identified in the silver interfaces were Ag–O, Ag–Si, and Ag–Al2O3. The covalent character Ag–O bond is crucial for layer adhesion, as it causes a shift to the high binding energy of Ag0in the Ag3d XPS spectrum. Enhanced silver multilayers retaining their reflectance and adhesion are essential for space optics in harsh environments.