Dynamic process of dendrite fragmentation in solidification from undercooled Si melt using time-resolved x-ray diffraction
Dynamic process of dendrite fragmentation in solidification from undercooled Si melt using time-resolved x-ray diffraction
复制标题
DOI：
10.1063/1.2764114
复制
发表时间：
2007-08
影响因子：
4
通讯作者：
K. Nagashio;K. Nozaki;K. Kuribayashi;Y. Katayama
中科院分区：
文献类型：
--
作者：
K. Nagashio;K. Nozaki;K. Kuribayashi;Y. Katayama
通过时间分辨二维 X 射线衍射分析了过冷硅熔体凝固过程中的自发枝晶碎裂。对于ΔT=261K凝固的样品，重辉后1ms出现了几个斑点，随后在～25ms内发生了从斑点到环的转变，这表明碎裂发生在重辉后，但仅发生在平台期的初始阶段。尽管本实验支持破碎的驱动力是平台期的毛细管效应，但破碎的时间尺度与当前的定量预测不同。
The spontaneous dendrite fragmentation in solidification from undercooled Si melt was analyzed by time-resolved two-dimensional x-ray diffractometry. For the sample solidified at ΔT=261K, several spots appeared at 1ms after recalescence and the subsequent transition from spots to rings occurred within ∼25ms, which suggests that the fragmentation occurred after recalescence but just at the initial stage of the plateau period. Although the present experiment supported that the driving force for the fragmentation is a capillarity effect at the plateau period, the time scale for the fragmentation differed from the current quantitative prediction.