Design and characterization of an undulator beamline optimized for small-angle coherent X-ray scattering at the Advanced Photon Source

Design and characterization of an undulator beamline optimized for small-angle coherent X-ray scattering at the Advanced Photon Source
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针对高级光子源小角度相干 X 射线散射而优化的波荡器光束线的设计和表征

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发表时间:
1999
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通讯作者:
M. Sutton
M. Sutton
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作者:
A. Sandy;L. Lurio;S. Mochrie;A. Malik;G. Stephenson;J. Pelletier;M. Sutton

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一个波荡器光束线和小角散射光谱仪已在先进的光子源。的光束线进行优化,进行小角度宽带通相干X射线散射测量,其特征在于测量静态X射线散斑图案从各向同性无序样品。散斑图案的统计分析已被执行的散斑宽度和对比度提取与波矢量传输和样品厚度。所测得的散斑宽度和对比度与强度相关函数的近似值进行比较,发现与其预测吻合良好。
An undulator beamline and small-angle-scattering spectrometer have been implemented at the Advanced Photon Source. The beamline is optimized for performing small-angle wide-bandpass coherent X-ray scattering measurements, and has been characterized by measuring static X-ray speckle patterns from isotropically disordered samples. Statistical analyses of the speckle patterns have been performed from which the speckle widths and contrast are extracted versus wavevector transfer and sample thickness. The measured speckle widths and contrast are compared with an approximation to the intensity correlation function and found to be in good agreement with its predictions.