Effects of Silver Doping on the Reliability of (Pb0.875 Ba0.125)[(Mg1/3 Nb2/3) 0. 5(Zn1/3 Nb2/3)0.3 Ti0.2] O3 Relaxor Dielectric Ceramics
Effects of Silver Doping on the Reliability of (Pb0.875 Ba0.125)[(Mg1/3 Nb2/3) 0. 5(Zn1/3 Nb2/3)0.3 Ti0.2] O3 Relaxor Dielectric Ceramics
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银掺杂对(Pb0.875 Ba0.125)[(Mg1/3 Nb2/3) 0. 5(Zn1/3 Nb2/3)0.3 Ti0.2] O3弛豫介质陶瓷可靠性的影响
DOI：
10.1111/j.1151-2916.1995.tb08465.x
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发表时间：
1995
期刊：
影响因子：
--
通讯作者：
Yohachi Yatnashita
中科院分区：
文献类型：
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作者：
H. Kanai;O. Furukawa;Shin‐ichi Nakamura;Masaru Hayashi;M. Yoshiki;Yohachi Yatnashita
研究了（Pb0.875Ba0.125）0.995 [（Mg 1/3 Nb 2/3）0.5（Zn 1/3 Nb 2/3）0.3Ti0.2] O3银掺杂介质陶瓷的可靠性，探讨了内电极中银向介质层的扩散对多层陶瓷电容器（MLCs）可靠性的影响。将银添加到介电陶瓷中降低了湿负载条件下的绝缘电阻。扫描透射电子显微镜（STEM）显示，富铅的晶界相存在于三相点的Ag掺杂试样。X射线光电子能谱（XPS）分析表明，富Pb相为PbO。绝缘电阻的退化被解释为银通过溶解在水中的晶界相从阳极迁移到阴极的结果。尽管通过STEM证实了银从MLC中的内部电极层扩散到介电层中，但未观察到第二相。需要深入研究银扩散对多层电容器在潮湿负载条件下绝缘电阻退化的影响
The reliability of the silver-doped dielectric ceramic (Pb 0.875 Ba 0.125 ) 0.995 [(Mg 1/3 Nb 2/3 ) 0.5 (Zn 1/3 Nb 2/3 ) 0.3 Ti 0.2 ]O 3 was investigated to speculate on the effects of silver diffusion from internal electrodes into dielectric layers on the reliability of multilayer ceramic capacitors (MLCs). The addition of silver into the dielectric ceramic degraded the insulation resistance under humid loading conditions. Scanning transmission electron microscopy (STEM) revealed that a Pb-rich grain boundary phase exists at triple points of Ag-doped specimens. The Pb-rich phase appeared to be PbO by X-ray photoelectron spectroscopy (XPS). Degradation of insulation resistance was interpreted as a result of silver migration from the anode to the cathode through a grain boundary phase dissolved in water. Although silver diffusion from internal electrode layers in MLCs into dielectric layers was confirmed by STEM, a secondary phase was not observed. Intensive study is needed to clarify the effect of silver diffusion on degradation of insulation resistance of MLCs under humid loading conditions