Non-negative matrix analysis in x-ray spectromicroscopy: choosing regularizers.

Non-negative matrix analysis in x-ray spectromicroscopy: choosing regularizers.
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X 射线光谱显微镜中的非负矩阵分析:选择正则化器。

DOI:
10.1063/1.4937528
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发表时间:
2016
期刊:
AIP conference proceedings
影响因子:
--
通讯作者:
Jacobsen,Chris
Jacobsen,Chris
中科院分区:
--
文献类型:
--
作者:
Mak,Rachel;Wild,StefanM;Jacobsen,Chris

文献摘要

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In x-ray spectromicroscopy, a set of images can be acquired across an absorption edge to reveal chemical speciation. We previously described the use of non-negative matrix approximation methods for improved classification and analysis of these types of data. We present here an approach to find appropriate values of regularization parameters for this optimization approach.