Physical investigation of electrophoretically deposited graphene oxide and reduced graphene oxide thin films
Physical investigation of electrophoretically deposited graphene oxide and reduced graphene oxide thin films
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DOI：
10.1063/1.4968000
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发表时间：
2016-11
影响因子：
3.2
通讯作者：
G. Politano;C. Versace;C. Vena;M. Castriota;F. Ciuchi;A. Fasanella;G. Desiderio;E. Cazzanelli
中科院分区：
文献类型：
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作者：
G. Politano;C. Versace;C. Vena;M. Castriota;F. Ciuchi;A. Fasanella;G. Desiderio;E. Cazzanelli
氧化石墨烯和还原氧化石墨烯薄膜是非常有前途的材料，因为它们可以用于光电器件和越来越多的应用，如触摸屏和柔性显示器。在这项工作中，氧化石墨烯（GO）和热还原氧化石墨烯（rGO）薄膜，沉积在钛/玻璃基板上，已获得电泳沉积。通过显微拉曼光谱、X射线衍射、扫描电镜等手段对样品的形貌和结构进行了表征。为了研究其光学和电学性质，进行了可变角椭圆偏振光谱和阻抗分析。热退火强烈地改变了结构、电学和光学性质，因为在热处理期间，一些量的最初存在于GO中的sp3键被去除。特别地，退火增强了rGO膜的欧姆行为，增加了其电导率和估计的光密度。而且...
Graphene oxide and reduced graphene oxide thin films are very promising materials because they can be used in optoelectronic devices and in a growing range of applications such as touch screens and flexible displays. In this work, graphene oxide (GO) and thermally reduced graphene oxide (rGO) thin films, deposited on Ti/glass substrates, have been obtained by electrophoretic deposition. The morphological and the structural properties of the samples have been investigated by micro-Raman technique, X-ray reflectometry, and SEM analysis. In order to study the optical and electrical properties, variable angle spectroscopic ellipsometry and impedance analysis have been performed. The thermal annealing changes strongly the structural, electrical, and optical properties, because during the thermal processes some amount of sp3 bonds originally present in GO were removed. In particular, the annealing enhances the Ohmic behavior of the rGO film increasing its conductivity and the estimated optical density. Moreover...