X-Ray and Electrooptical Studies of Liquid Crystal Siloxane with a de Vries SmA* Phase
X-Ray and Electrooptical Studies of Liquid Crystal Siloxane with a de Vries SmA* Phase
复制标题
具有 de Vries SmA* 相的液晶硅氧烷的 X 射线和光电研究
DOI：
10.1080/00150190600962176
复制
发表时间：
2006
期刊：
影响因子：
0.8
通讯作者：
W. Kuczyński
中科院分区：
文献类型：
--
作者：
F. Goc;C. Blanc;V. Lorman;M. Nobili;S. Samaritani;G. Galli;W. Kuczyński
我们提出了X射线衍射，偏光显微镜和电光响应的手性液晶硅氧烷DSi 3-MR 11 [1]的研究与德弗里斯型行为。在很宽的温度范围内（Δ T ≤ 50°C），材料没有层收缩，但层间距随温度呈微弱的近似线性变化。在SmA*-SmC* 转变处既不发生不连续也不发生斜率变化。此外，使用的X射线数据，不寻常的电光响应在第一和第二谐波与已知的热行为的双折射，我们证明了交叉从经典正交的德弗里斯一样的SmA* 制度在DSi 3-MR 11硅氧烷。
We present the X-ray diffraction, polarizing optical microscopy and electrooptic response studies of the chiral liquid crystal siloxane DSi3-MR11 [1] with a de Vries-type behavior. In a wide temperature range (Δ T ∼ 50°C) the material shows no layer shrinkage but a weak nearly linear layer spacing variation with temperature. Neither discontinuity nor slope change occurs at the SmA*-SmC* transition. In addition, using the X-ray data, the unusual electrooptic response in both 1st and 2nd harmonics together with known thermal behavior of birefringence, we evidence the cross-over from the classical orthogonal to the de Vries-like SmA* regime in DSi3-MR11 siloxane.