Detecting Recycled SoCs by Exploiting Aging Induced Biases in Memory Cells

Detecting Recycled SoCs by Exploiting Aging Induced Biases in Memory Cells
复制标题

DOI:
10.1109/hst.2019.8741032
复制
发表时间:
2019-05
期刊:
2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
影响因子:
--
通讯作者:
Ujjwal Guin;Wendong Wang;Charles Harper;A. Singh
Ujjwal Guin;Wendong Wang;Charles Harper;A. Singh
中科院分区:
其他
文献类型:
--
作者:
Ujjwal Guin;Wendong Wang;Charles Harper;A. Singh

文献摘要

被引文献

相似文献

通过全球半导体供应链作为新产品销售的回收集成电路的兴起是一个严重的威胁,因为与正品相比,它们的质量较差,剩余寿命较短,性能可能较差。虽然已经提出了针对新设计的解决方案,例如片上年龄监视器,但检测已在使用的旧遗留IC的回收要困难得多;目前不存在可靠的解决方案。在本文中,我们提出了一种新的和高效的方法来检测回收的IC,利用上电状态的片上SRAM来评估芯片的年龄。我们的方法不需要引入任何特殊的老化检测电路,也不需要记录和保存历史电路性能数据作为检测使用退化的参考。相反,我们利用新的观察,在一个新的未使用的SRAM中,相同数量的细胞电源0和1的逻辑状态,而且这种分布变得歪斜的时间,由于老化的操作。由于SRAM存在于几乎所有的片上系统(SoC)中,因此这种简单的老化检测方法广泛适用于旧设计和新设计。它也是低成本的,因为不需要任何特殊的测试设备。我们目前的实验结果使用商业现成的SRAM芯片,以验证所提出的方法的有效性。
The rise of recycled ICs being sold as new through the global semiconductor supply chain is a serious threat due to their inferior quality, shorter remaining life, and potentially poorer performance, compared to their authentic counterparts. While solutions, such as on-chip age monitors, have been proposed for new designs, detecting the recycling of older legacy ICs already in use is much harder; no reliable solution currently exists. In this paper, we propose a new and highly effective approach for detecting recycled ICs by exploiting the powerup state of on-chip SRAMs to evaluate the age of the chip. Our methodology does not require the introduction of any special aging detection circuitry, nor the recording and saving of historical circuit performance data as a reference to detect degradation from use. Instead, we exploit the novel observation that in a new unused SRAM, an equal number of cells power up to the 0 and 1 logic states, and also that this distribution becomes skewed in time due to aging in operation. Since SRAMs exist in virtually all systems-on-chip (SoCs), this simple aging detection method is widely applicable to both old and new designs. It is also low cost since does not require any special test equipment. We present experimental results using commercial off-the-shelf SRAM chips to validate the effectiveness of the proposed approach.