Development of a System to Analyse the Structure of a Submicrometre-Sized Single Crystal by Synchrotron X-ray Diffraction
Development of a System to Analyse the Structure of a Submicrometre-Sized Single Crystal by Synchrotron X-ray Diffraction
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开发通过同步加速器 X 射线衍射分析亚微米尺寸单晶结构的系统
DOI：
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发表时间：
1991
期刊：
影响因子：
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通讯作者：
M. Ohmasa
中科院分区：
文献类型：
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作者：
K. Ohsumi;K. Hagiya;M. Ohmasa
KEK光子工厂(PF)研制了一套用于分析亚微米级单晶结构的同步辐射(SR)系统。采用劳厄法和成像板相结合的方法采集衍射光强。为了减少背景，实验是在真空中进行的，入射X射线非常薄，准直程度很高。该系统已经达到了这样的水平，一个直径小到0.8Ixm的钼球被发现是孪晶，并测定了孪晶的体积比，以及一个各向同性的温度因子，这与在同一实验中在另一个几乎相同尺寸的单晶球上测得的值相当。这与粉末衍射法测定的结果符合得很好。研究表明，任何在光学显微镜下可以探测到的单晶都可以被分析，并且可以探测到由109个原子组成的体积为0.02IXm3的单晶的衍射强度。
A system has been developed for the analysis of the structure of a submicrometer-sized single crystal using synchrotron radiation (SR) at the Photon Factory (PF), KEK. The Laue method combined with an imaging plate was employed for the collection of diffracted intensities. To reduce background, the experiment was carried out in a vacuum and with a very thinly collimated incident X-ray beam. The system has been shown to reach a level where a molybdenum sphere with diameter as small as 0.8 Ixm was found to be twinned and the volume ratio of the twin domains was determined, together with an isotropic temperature factor, which was comparable with the value determined in the same experiment on another single-crystal sphere of almost the same size. It was in good agreement with that determined by a powder diffraction study. The present study showed that any single crystal detectable under an optical microscope can be analysed and, further, that the diffraction intensities from a crystal with volume of 0.02 Ix m 3, which is composed of 10 9 atoms, can be detected.