Scanning tunneling microscopy on Sn/Si(110) system
Scanning tunneling microscopy on Sn/Si(110) system
复制标题
Sn/Si(110) 系统上的扫描隧道显微镜
DOI:
10.1016/s0169-4332(98)00036-1
复制
发表时间:
1998
影响因子:
6.7
通讯作者:
K. Ueda
中科院分区:
文献类型:
--
作者:
T. An;M. Yoshimura;K. Ueda
Surface superstructures on Sn/Si(110) system were investigated by scanning tunneling microscopy (STM). In addition to three superstructures reported previously, (4,3)×(2̄,2), (3,0)×(1̄,3) and (3,3)×(2̄,1), new types of superstructures such as (2,0)×(1̄,4) were clearly observed during transformation processes between these phases. It was found that the (4,3)×(2̄,2) and (3,0)×(1̄,3) consist of Sn trimers which arrange two- and one-dimensionally on the surface, respectively. The latter superstructure contains extra Sn atoms as monomers. The image of (3,3)×(2̄,1) consists of cluster protrusions that contain four or more Sn atoms arranged two-dimensionally. It was also found that the (2,0)×(1̄,4) superstructure consists of Sn dimer rows along the [1̄10] direction. Transition processes between the phases is discussed, based on the structural models proposed in the present study.