Evaluation of phase correcting mirrors for an 84 GHz gyrotron based on direct phase measurements at low-power level
Evaluation of phase correcting mirrors for an 84 GHz gyrotron based on direct phase measurements at low-power level
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基于低功率水平下的直接相位测量对 84 GHz 陀螺仪相位校正镜进行评估
DOI：
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发表时间：
2005
期刊：
影响因子：
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通讯作者：
R. J. Temkind
中科院分区：
文献类型：
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作者：
T. Notakea;H. Ideib;T. Shimozumac;M. Satoc;S. Kuboc;S. Itoc;Y. Takitac;K. Ohkuboc;Y. Yoshimurac;S. Kobayashic;Y. Mizunoc;T. Wataric;R. Kumazawac;M. A. Shapirod;R. J. Temkind
利用矢量网络分析仪构建了一个低功耗测试系统，用于评估匹配光学单元（MOU）中相位校正镜的性能。MOU是用来促进毫米波束从回旋管到波纹波导的良好耦合。新开发的诊断系统使我们不仅可以进行测量，而且可以测试高斯yzer。在创。使用les。良好的g镜不仅可以改变毫米波光束的强度分布，而且可以改变其相位分布，为设计高精度准光学系统开辟了新的可能性。低功耗测试进行了评估的新设计的MOU的输出端口的光注入的MOU的性能。用此逆过程对MOU输入端的输出光束进行了测量，将注入的高斯光束转换为陀螺相关分析辐射出的真实的光束图，并将测量的电场与计算的电场进行了幅值和相位的比较，测量结果与计算结果基本一致。因此，可以判断MOU中的相位校正将在即将到来的大功率测试中正确工作。© 2005 Elsevier B.V.保留所有权利。
A low-power test system using a vector network analyzer is constructed to evaluate the performance of phase correcting mirrors in a matching optics unit (MOU). The MOU is used in order to facilitate the good coupling of a millimeter wave beam from a gyrotron into corrugated waveguides. The newly developed diagnostic system allows us to make measurements not only nd testing Gaussian yzer. In tron. Using les. Good g mirrors in of uxved of intensity-, but also of phase-profiles of millimeter wave beams and opens a new range of possibilities for designing a high-precision quasi-optical systems. Low-power tests are carried out to evaluate the performance of the newly designed MOU by reversely injecting a beam from the output port of the MOU. The output beam from the input port of the MOU is measured with the anal this inverse process, the injected Gaussian beam should be converted to the real beam pattern radiated from the gyro correlation analysis, the measuredand calculated-electric fields are compared in their amplitudeand phase-profi agreement between the measurement and the calculation is obtained. Therefore, it is judged that the phase-correctin the MOU will work correctly in upcoming high-power tests. © 2005 Elsevier B.V. All rights reserved.