Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study
Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study
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DOI：
10.1063/1.4870710
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发表时间：
2014-04-14
影响因子：
3.2
通讯作者：
Melin, T.
中科院分区：
文献类型：
--
作者：
Barbet, S.;Popoff, M.;Melin, T.
我们在本文中全面研究了交流串扰效应在开尔文探针力显微镜 (KPFM) 中的作用及其对 KPFM 成像的影响。回顾了 KPFM 信号对内部参数（例如悬臂激励频率和 KPFM 反馈环路的投影角度）的依赖性，并与分析模型进行了比较。我们表明，交流串扰对测量的 KPFM 信号的影响是尖端-基底距离的函数，从而阻碍了三维 KPFM 信号的测量。交流串扰的影响也以 KPFM 图像上的地形足迹的形式展示在 KPFM 图像上，特别是在恒定距离（提升）成像模式下。我们的分析适用于明确探测环境空气中烟草花叶病毒 (TMV) 的电荷效应。当沉积在二氧化硅表面上时，TMV 被证明是电中性的，但当沉积在金表面上时，TMV 带有不均匀的负电荷。 (C) 2014 AIP 出版有限责任公司。
We provide in this article a comprehensive study of the role of ac cross-talk effects in Kelvin Probe Force Microscopy (KPFM), and their consequences onto KPFM imaging. The dependence of KPFM signals upon internal parameters such as the cantilever excitation frequency and the projection angle of the KPFM feedback loop is reviewed, and compared with an analytical model. We show that ac cross-talks affect the measured KPFM signals as a function of the tip-substrate distance, and thus hamper the measurement of three-dimensional KPFM signals. The influence of ac cross-talks is also demonstrated onto KPFM images, in the form of topography footprints onto KPFM images, especially in the constant distance (lift) imaging mode. Our analysis is applied to unambiguously probe charging effects in tobacco mosaic viruses (TMVs) in ambient air. TMVs are demonstrated to be electrically neutral when deposited on silicon dioxide surfaces, but inhomogeneously negatively charged when deposited on a gold surface. (C) 2014 AIP Publishing LLC.