Erratum: Scanning Ion Conductance Microscopy of Nafion-Modified Nanopores [J. Electrochem. Soc., 170, 066510 (2023)]
Erratum: Scanning Ion Conductance Microscopy of Nafion-Modified Nanopores [J. Electrochem. Soc., 170, 066510 (2023)]
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勘误：Nafion 修饰纳米孔的扫描离子电导显微镜 [J。
DOI：
10.1149/1945-7111/acf793
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发表时间：
2023
影响因子：
3.9
通讯作者：
Baker, Lane A
中科院分区：
文献类型：
--
作者：
Alanis, Kristen;Siwy, Zuzanna S;Baker, Lane A
氮化硅膜中的单个纳米孔用 Nafion 进行不对称修饰，并通过扫描离子电导显微镜进行研究，其中 Nafion 改变了纳米孔处的局部离子浓度。研究了施加的跨膜电位对局部离子浓度的影响，其中 Nafion 膜提供了靠近纳米孔的阳离子库。在纳米孔的电流-电压响应以及纳米孔附近的 SICM 纳米移液器的接近曲线中观察到基于离子浓差极化的流体二极管。实验结果得到有限元方法模拟的支持，该模拟详细描述了纳米孔/Nafion/纳米移液器环境的离子消耗和富集。
Single nanopores in silicon nitride membranes are asymmetrically modified with Nafion and investigated with scanning ion conductance microscopy, where Nafion alters local ion concentrations at the nanopore. Effects of applied transmembrane potentials on local ion concentrations are examined, with the Nafion film providing a reservoir of cations in close proximity to the nanopore. Fluidic diodes based on ion concentration polarization are observed in the current-voltage response of the nanopore and in approach curves of SICM nanopipette in the vicinity of the nanopore. Experimental results are supported with finite element method simulations that detail ion depletion and enrichment of the nanopore/Nafion/nanopipette environment.