Multi-cycle Test with Partial Observation on Scan-Based BIST Structure
Multi-cycle Test with Partial Observation on Scan-Based BIST Structure
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基于扫描的 BIST 结构的多周期测试和部分观察
DOI：
10.1109/ats.2011.34
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
S. Kajihara
中科院分区：
文献类型：
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作者：
Yasuo Sato;Hisato Yamaguchi;Makoto Matsuzono;S. Kajihara
可靠性的现场测试通常使用少量的内存资源进行，并且需要一种新技术，这可能与常规制造测试有所不同。本文提出了一种新的技术，可改善故障覆盖范围或减少实现基于扫描的剑剑结构的给定故障覆盖所需的测试向量的数量。我们评估了一种多周期测试方法，该方法在捕获模式期间观察芯片上部分触发器的值。实验结果表明，部分观察结果可以通过小型硬件开销来改善故障覆盖范围，而不是完整的观察。
Field test for reliability is usually performed with small amount of memory resource, and it requires a new technique which might be somewhat different from the conventional manufacturing tests. This paper proposes a novel technique that improves fault coverage or reduces the number of test vectors that is needed for achieving the given fault coverage on scan-based BIST structure. We evaluate a multi-cycle test method that observes the values of partial flip-flops on a chip during capture-mode. The experimental result shows that the partial observation achieves fault coverage improvement with small hardware overhead than the full observation.