A new built-in self-test (BIST) for a RF low-noise amplifier (LNA)
A new built-in self-test (BIST) for a RF low-noise amplifier (LNA)
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用于射频低噪声放大器 (LNA) 的新型内置自测试 (BIST)
DOI：
10.1109/dtis.2010.5487559
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发表时间：
2010
期刊：
影响因子：
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通讯作者：
M. Masmoudi
中科院分区：
文献类型：
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作者：
R. Ayadi;M. Masmoudi
本文提出了一种用于865-870 MHz低噪声放大器（LNAs）的新型射频内置自检（BIST）电路；BIST和LNA电路采用0.35µm CMOS技术设计。测试电路简单，由一个射频峰值检测器和两个比较器组成，故障覆盖率高。介绍了模拟可能的灾难性故障和参数故障的故障。在LNA中共引入了28个短开故障和10个参数变化，灾难性故障的故障覆盖率为89%，过程变化的故障覆盖率为90%。
In this paper, we present a new RF built-in self test (BIST) circuit for 865–870 MHz low noise amplifiers (LNAs); The BIST and LNA circuit is designed using 0.35µm CMOS technology. The simple circuit of test that contains a RF peak detectors and two comparators brings high fault coverage. The faults simulating possible catastrophic and parametric faults are introduced. A total of twenty eight short and open faults and ten parameters variation have been introduced into the LNA, giving fault coverage of 89% for catastrophic faults and 90% for process variation.