Gate induced crossover between Fabry-Pérot and quantum dot behavior in a single walled carbon nanotube hole transistor
Gate induced crossover between Fabry-Pérot and quantum dot behavior in a single walled carbon nanotube hole transistor
复制标题
单壁碳纳米管孔晶体管中法布里-珀罗和量子点行为之间的栅极诱导交叉
DOI:
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发表时间:
2009
期刊:
影响因子:
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通讯作者:
K. Matsumoto
中科院分区:
文献类型:
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作者:
T. Kamimura;K. Matsumoto
Gate induced crossover between Fabry–Perot and quantum dot behavior in a single walled carbon nanotube(SWCNT) hole transistor is observed. The SWCNTtransistor that can operate as a resonant tunnelingtransistor (RTT) and also as a single-hole transistor (SHT) using SWCNT as channel is fabricated. When negatively high voltage is applied to the gate electrode, the SWCNTtransistor shows RTT characteristic, e.g., Fabry–Perot quantum interference pattern. While, when negatively low voltage is applied to the gate electrode, the SWCNTtransistor shows SHT characteristic, e.g., Coulomb diamond characteristic. The transition between RTT and SHT is achieved by modulating the coupling strength between the electrode and the quantum island using gate voltage change. Schottky barriers at the contact between the SWCNT and the electrodes act as tunneling barriers. The thicknesses of the tunneling barriers are modulated by the gate voltage change, and the strength of the coupling between the electrode and quantum island is also changed. The characteristics of the convertible transistor can be observed up to 100 K . Moreover, the channel length dependence is observed.