Microwave distribution in stacked Bi2Sr2CaCu2O8+x intrinsic Josephson junctions in a transmission-line geometry
Microwave distribution in stacked Bi2Sr2CaCu2O8+x intrinsic Josephson junctions in a transmission-line geometry
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传输线几何结构中堆叠 Bi2Sr2CaCu2O8 x 本征约瑟夫森结中的微波分布
DOI：
10.1063/1.1610258
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发表时间：
2003
影响因子：
4
通讯作者：
Hu
中科院分区：
文献类型：
--
作者：
M. Bae;Hu
研究了矩形叠层（15 μm×0.72 μm×60 nm）Bi2Sr2CaCu2O8+x本征约瑟夫森结（IJs）内的微波分布。该堆叠被微加工成传输线几何形状，在堆叠的顶部和底部沉积有几百nm厚的Au层。通过测量不同微波功率下W波段IJs隧穿临界电流的异常抑制来监测微波分布。这种技术可以提供有价值的信息的微波传输模式内的夹层堆叠的IJs，这是非常重要的高频器件应用，使用IJs，如磁通流太赫兹振荡器。
The microwave distribution inside a rectangular stack (15 μm×0.72 μm×60 nm) of Bi2Sr2CaCu2O8+x intrinsic Josephson junctions (IJJs) was studied. The stack was microfabricated into a transmission-line geometry, with a-few-hundred-nm-thick Au layers deposited on the top and bottom of the stack. The microwave distribution was monitored by measuring the anomalous suppression of the tunneling critical current of the IJJs with varied microwave power at frequencies in the W band. This technique can provide valuable information on the microwave transmission modes inside the sandwiched stack of IJJs, which is utterly important for the high-frequency device applications using IJJs, such as fluxon-flow THz oscillators.