Aging phenomena in polystyrene thin films
Aging phenomena in polystyrene thin films
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DOI：
10.1140/epjst/e2007-00040-0
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发表时间：
2007-02
期刊：
影响因子：
--
通讯作者：
K. Fukao;H. Koizumi
中科院分区：
文献类型：
--
作者：
K. Fukao;H. Koizumi
通过复电容法研究了无规聚苯乙烯薄膜的老化行为。在等温时效过程中，电容的实部随时效时间的延长而增大，虚部随时效时间的延长而减小。这一结果表明，实部和虚部的老化时间关系分别与厚度和介电常数的变化有关。在薄膜中，厚度取决于甚至在玻璃化转变以上的老化热历史。记忆和“返老还童”效应也在薄膜中观察到。
The aging behavior is investigated for thin films of atactic polystyrene through measurements of complex electric capacitance. During isothermal aging process the real part of the electric capacitance increases with aging time, while the imaginary part decreases with aging time. This result suggests that the aging time dependence of the real and imaginary parts are mainly associated with change in thickness and dielectric permittivity, respectively. In thin films, the thickness depends on thermal history of aging even above the glass transition. Memory and `rejuvenation' effects are also observed in the thin films.