Complementary use of transmission electron microscopy and atom probe tomography for the investigation of steels nanostructured by severe plastic deformation
Complementary use of transmission electron microscopy and atom probe tomography for the investigation of steels nanostructured by severe plastic deformation
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DOI：
10.1016/j.scriptamat.2009.02.019
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发表时间：
2009-06
影响因子：
6
通讯作者：
X. Sauvage;W. Lefebvre;C. Genevois;S. Ohsaki;K. Hono
中科院分区：
文献类型：
--
作者：
X. Sauvage;W. Lefebvre;C. Genevois;S. Ohsaki;K. Hono
块体纳米结构材料的性质通常由原子尺度特征控制，例如沿沿着缺陷的偏析或成分梯度。在这里，我们讨论的互补使用透射电子显微镜和原子探针断层扫描，以获得一个完整的描述纳米结构。根据在严重变形钢中收集的实验数据，强调了这两种技术的优点和局限性，特别强调了碳的空间分布。
The properties of bulk nanostructured materials are often controlled by atomic-scale features such as segregation along defects or composition gradients. Here we discuss the complementary use of transmission electron microscopy and atom probe tomography to obtain a full description of nanostructures. The advantages and limitations of both techniques are highlighted on the basis of experimental data collected in severely deformed steels with a special emphasis on carbon spatial distribution.