Adhesion measurements using telephone cord buckles
Adhesion measurements using telephone cord buckles
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DOI：
10.1016/j.msea.2006.08.027
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发表时间：
2007-01-15
期刊：
影响因子：
6.4
通讯作者：
Gerberich, W. W.
中科院分区：
文献类型：
--
作者：
Cordill, M. J.;Bahr, D. F.;Gerberich, W. W.
薄膜的附着能可以用电话线的几何形状来计算。可以通过带扣的拐点或带扣的中心来测量带扣，并将其建模为具有均匀宽度和高度的直带扣。在钨-硅系统中，一个独特的分层形态涉及到从直线到电话线扣的过渡。该结构用于比较各种测量技术。直的和电话线形态之间的稳定性范围已经被证明比先前描述的更宽，并且表现出从直的到电话线结构的平滑过渡。测量直边弯曲产生的粘附能在15%以内的值计算时，近似的电话线作为一个直边的结构在弯曲的拐点。(c)2006 Elsevier B. V.保留所有权利。
Thin film adhesion energies can be calculated using buckles with the telephone cord geometry. The buckles can be measured through the point of inflection of the buckle or through the center of the buckle and modeled as a straight buckle of uniform width and height. In the tungsten-silica system, a unique delamination morphology involved a transition from the straight to telephone cord buckle. This structure was used to compare various measurement techniques. The stability range between the straight and telephone cord morphology has been shown to be broader than previously described and exhibits a smooth transition from the straight to telephone cord structure. Measurements of the straight-sided buckles produce adhesion energies which are within 15% of the values calculated when approximating the telephone cord as a straight-sided structure at the inflection point of the buckle. (c) 2006 Elsevier B.V. All rights reserved.