Surface-initiated, ring-opening polymerization of p-dioxanone from gold and silicon oxide surfaces
Surface-initiated, ring-opening polymerization of p-dioxanone from gold and silicon oxide surfaces
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DOI：
10.1039/b305903k
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发表时间：
2003-01-01
影响因子：
--
通讯作者：
Choi, IS
中科院分区：
文献类型：
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作者：
Yoon, KR;Chi, YS;Choi, IS
通过自组装的以羟基终止的单层膜的形成和对二氧环酮（PDX）的表面引发开环聚合（ROP），在平坦的固体表面上生长出了可生物降解的聚对二氧环酮（PPDX）聚合物薄膜。以八酸锡（II） [Sn(Oct)(2)]为催化剂，选择金表面和氧化硅表面作为模型表面。将金和氧化硅衬底分别浸入烷乙酯溶液和三乙氧基硅烷溶液中，形成分子有序的薄膜（自组装单层，SAM）。聚合是通过在无水甲苯中加热Sn(Oct) 2， PDX和覆有钐的衬底的混合物24小时来实现的，温度为55度（对于金衬底）或70度（对于氧化硅衬底）。在偏振红外外反射光谱（PIERS）中观察到PPDX的特征红外峰（C-H在2923 cm（-1）附近伸展，CO酯在1748 cm（-1）附近伸展），表明PPDX薄膜存在于氧化金和氧化硅表面。利用椭偏仪测得PPDX薄膜在金衬底上的平均厚度为90 nm，在氧化硅衬底上的平均厚度为46 nm。利用x射线光电子能谱（XPS）、接触角测量和原子力显微镜（AFM）对PPDX薄膜进行了进一步的表征。
A polymeric thin film of a biodegradable poly(p-dioxanone) (PPDX) was grown from flat solid surfaces by a combination of formation of self-assembled monolayers terminating in hydroxyl groups and surface-initiated, ring-opening polymerization (ROP) of p-dioxanone (PDX). Tin(II) octoate [Sn(Oct)(2)] was used as a catalyst, and gold and silicon oxide surfaces were chosen as model surfaces. A molecularly-ordered film (self-assembled monolayer, SAM) was formed by immersing gold and silicon oxide substrates in a solution of alkanethiolates and in a solution of triethoxysilanes, respectively. The polymerization was achieved by heating a mixture of Sn(Oct) 2, PDX, and the SAM-coated substrate in anhydrous toluene for 24 h at 55degreesC (for a gold substrate) or 70degreesC (for a silicon oxide substrate). The characteristic IR peaks of PPDX (C-H stretching at similar to2923 cm(-1) and the CO ester at similar to1748 cm(-1)) were observed in polarized infrared external reflectance spectroscopy (PIERS) spectra, indicating the presence of a PPDX film on the gold and silicon oxide surfaces. The average thickness of the PPDX film was measured to be 90 nm on the gold substrate and 46 nm on the silicon oxide substrate by ellipsometry. The PPDX films were further characterized by X-ray photoelectron spectroscopy (XPS), contact angle measurement, and atomic force microscopy (AFM).