A New variable temperature solution-solid interface scanning tunneling microscope
A New variable temperature solution-solid interface scanning tunneling microscope
复制标题
一种新型变温解决方案——固体界面扫描隧道显微镜
DOI：
10.1017/s143192761501171x
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发表时间：
2014
影响因子：
2.8
通讯作者：
K. W. Hipps
中科院分区：
文献类型：
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作者：
Abdolreza Jahanbekam;U. Mazur;K. W. Hipps
我们提出了一种新的溶液-固体(SS)界面扫描隧道显微镜设计，它可以在高温、低热漂移和使用挥发性溶剂的情况下成像。在这种与传统设计不同的新设计中，整个显微镜被包围在一个可控温、可控气氛的腔室中。这使用户可以在高温下进行测量，同时最大限度地减少热漂移。通过在色谱室中加入开放式溶液储存库，最大限度地减少了样品中的溶剂挥发；允许用户在高温下使用挥发性溶剂进行温度相关研究。新的设计使用户能够在SS界面上使用一些挥发性溶剂长时间成像(>；24小时)。研究了压电扫描器横向非线性随温度的增加。用该仪器研究了钴(II)八乙基卟啉(CoOEP)在甲苯/Au(111)界面上的温度效应。结果表明，在24 °C到75 °C的实验误差范围内，晶格参数保持不变，在整个温度范围内获得了类似质量的图像。在甲苯/Au界面的晶胞参数为：A=(1.3 6±0.0 4)nm，B=(2.5 1±0.0 4)nm，α=97°±2°。
We present a new solution-solid (SS) interface scanning tunneling microscope design that enables imaging at high temperatures with low thermal drift and with volatile solvents. In this new design, distinct from the conventional designs, the entire microscope is surrounded in a controlled-temperature and controlled-atmosphere chamber. This allows users to take measurements at high temperatures while minimizing thermal drift. By incorporating an open solution reservoir in the chamber, solvent evaporation from the sample is minimized; allowing users to use volatile solvents for temperature dependent studies at high temperatures. The new design enables the user to image at the SS interface with some volatile solvents for long periods of time (>24 h). An increase in the nonlinearity of the piezoelectric scanner in the lateral direction as a function of temperature is addressed. A temperature dependent study of cobalt(II) octaethylporphyrin (CoOEP) at the toluene/Au(111) interface has been performed with this instrument. It is demonstrated that the lattice parameters remain constant within experimental error from 24 °C to 75 °C. Similar quality images were obtained over the entire temperature range. We report the unit cell of CoOEP at the toluene/Au(111) interface (based on two molecules per unit cell) to be A = (1.36 ± 0.04) nm, B = (2.51 ± 0.04) nm, and α = 97° ± 2°.