A NEW PROBE FOR MEASURING ELECTROLYTIC CONDUCTANCE
A NEW PROBE FOR MEASURING ELECTROLYTIC CONDUCTANCE
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DOI：
10.1016/0925-4005(93)85368-k
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发表时间：
1993-05-01
影响因子：
8.4
通讯作者：
BERGVELD, P
中科院分区：
文献类型：
--
作者：
OLTHUIS, W;VOLANSCHI, A;BERGVELD, P
提出并实现了一种电极上覆盖110nm厚的Ta2O5绝缘膜的电导电池。总氧化物/溶液界面的稳定和非常低的阻抗很大程度上减少了氧化还原过程的干扰。在恒流和恒压工作模式下，输出电压在10至600 mV之间，比电阻在0.1至8 kOMEGA之间的函数的测量结果与理论计算结果一致。
A conductance cell of which the electrodes are provided with a 110 nm thick Ta2O5 insulating film is proposed and realized. The stable and very low impedance of the total oxide/solution interface largely reduces interference from redox processes. Measurement results, given as an output voltage between 10 and 600 mV as a function of the specific resistance between 0.1 and 8 kOMEGA, are shown to be in agreement with theoretically calculated results, both at the constant current and constant voltage mode of operation.