Determination of small level splittings in highly charged ions via angle-resolved measurements of characteristic x rays
Determination of small level splittings in highly charged ions via angle-resolved measurements of characteristic x rays
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DOI：
10.1103/physreva.90.052515
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发表时间：
2014-11
影响因子：
2.9
通讯作者：
Z. Wu;N. Kabachnik;A. Surzhykov;C. Dong;S. Fritzsche
中科院分区：
文献类型：
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作者：
Z. Wu;N. Kabachnik;A. Surzhykov;C. Dong;S. Fritzsche
