Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
复制标题
串扰引起的故障的测试生成：框架和计算结果
DOI：
10.1109/ats.2000.893641
复制
发表时间：
2000
期刊：
影响因子：
--
通讯作者：
M. Breuer
中科院分区：
文献类型：
--
作者：
Weiyu Chen;S. Gupta;M. Breuer
由于技术缩放和增加的时钟频率，由噪声效应引起的问题导致设计/调试工作的增加和电路性能的降低。针对数字组合电路中的脉冲、信号加速和减速等串扰效应，提出了一种高效、准确的双矢量测试方法。这些噪声效应可以通过电路传播，并在锁存器或主输出端产生逻辑错误。我们开发了一种名为XGEN的混合信号测试发生器，它包含经典的静态值以及动态信号（例如转换和脉冲）以及定时信息（例如信号到达时间、上升/下降时间和门延迟）。在本文中，我们首先讨论的测试生成算法的一般框架，其次是计算结果。与SPICE模拟结果的比较证实了这种方法的准确性。
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. These noise effects can propagate through a circuit and create a logic error in a latch or at a primary output. We have developed a mixed-signal test generator, called XGEN, that incorporates classical static values as well as dynamic signals such as transitions and pulses, and timing information such as signal arrival times, rise/fall times, and gate delay. In this paper we first discuss the general framework of the test generation algorithm followed by computational results. Comparison of results with SPICE simulations confirms the accuracy of this approach.