Atomic resolved Phase Map of monolayer MoS2 retrieved by Spherical Aberration-Corrected Transport of Intensity Equation
Atomic resolved Phase Map of monolayer MoS2 retrieved by Spherical Aberration-Corrected Transport of Intensity Equation
复制标题
通过球面像差校正强度传输方程检索单层 MoS2 的原子分辨相图
DOI：
10.1093/jmicro/dfw026
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发表时间：
2016
期刊：
影响因子：
1.8
通讯作者：
X. Zhang and Y. Oshima
中科院分区：
文献类型：
--
作者：
S. Kim;S. Lee;K. W. Nam;J. Shin;S. Y. Lim;W. Cho;K. Suzuki;Y. Oshima;M. Hirayama;R. Kanno and J. W. Choi;X. Zhang and Y. Oshima
本文指出，利用输运强度方程（TIE）获取两幅离焦差较小的原子分辨透射电子显微镜（TEM）图像时，可以获得原子分辨相图，使我们能够在原子尺度上观察电荷分布或磁性。在这项工作中，我们首次使用球面像差校正的透射电子显微镜获得了脱落的二硫化钼片的原子分辨相图。我们成功地观察到了机械剥离的单层二硫化钼片的60°晶界。得到了单个钼原子柱与两个硫原子柱的相对相移平均约为0.01 rad，比模拟的TIE相图低了约一半，表明可以定性地区分单个原子位。简要讨论了获取原子分辨钛相图的适当条件。
An atomic resolution phase map, which enables us to observe charge distribution or magnetic properties at an atomic scale, has been pointed out to be retrieved by transport of intensity equation (TIE) when taking two atomic-resolved transmission electron microscope (TEM) images of small defocus difference. In this work, we firstly obtained the atomic-resolved phase maps of an exfoliated molybdenum disulfide sheet using spherical aberration-corrected transmission electron microscope. We successfully observed 60° grain boundary of mechanically exfoliated monolayer molybdenum disulfide sheet. The relative phase shift of a single molybdenum atomic column to the column consisting of two sulfur atoms was obtained to be about 0.01 rad on average, which was about half lower than the simulated TIE phase map, indicating that the individual atomic sites can be distinguished qualitatively. The appropriate condition for retrieving atomic-resolved TIE phase maps was briefly discussed.