In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films
In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films
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DOI：
10.1063/1.4907394
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发表时间：
2015-02-07
影响因子：
3.2
通讯作者：
Trolier-McKinstry, S.
中科院分区：
文献类型：
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作者：
Wallace, M.;Johnson-Wilke, R. L.;Trolier-McKinstry, S.
在不同的力学边界条件下，测量了厚度为1.9µm、掺杂1%Mn的四方(001)取向PbZr0.3Ti0.7O3薄膜的铁电/铁弹磁畴重取向。通过002/200Bragg反射强度随外加电场的变化来量化磁畴的重定向。为了改变夹持程度，薄膜从下层衬底上切下0%，类似于25%，类似于50%，或类似于电极面积的75%。当从衬底上剥离的量从0%增加到接近75%时，薄膜中的铁电/铁弹性磁畴重新取向程度在3倍的矫顽场下增加了6倍以上。在类似于从衬底释放75%的薄膜中，大约26%的90度磁区在最大外加磁场下被重新定向；与类似成分的块体陶瓷相比，该磁区重新定向值更好。在这些条件下，一部完全上映的电影中90度结构域重新定向的上限估计为32%。研究还发现，不同的夹持条件对去掉外加磁场后的再定向量有很大的影响，在去夹层薄膜中观察到了较高的择优磁化取向残余量。(C)2015 AIP出版有限责任公司。
Ferroelectric/ferroelastic domain reorientation was measured in a 1.9 mu m thick tetragonal {001} oriented PbZr0.3Ti0.7O3 thin film doped with 1% Mn under different mechanical boundary constraints. Domain reorientation was quantified through the intensity changes in the 002/200 Bragg reflections as a function of applied electric field. To alter the degree of clamping, films were undercut from the underlying substrate by 0%, similar to 25%, similar to 50%, or similar to 75% of the electrode area. As the amount of declamping from the substrate increased from 0% to similar to 75%, the degree of ferroelectric/ferroelastic domain reorientation in the films increased more than six fold at three times the coercive field. In a film that was similar to 75% released from the substrate, approximately 26% of 90 degrees domains were reoriented under the maximum applied field; this value for domain reorientation compares favorably to bulk ceramics of similar compositions. An estimate for the upper limit of 90 degrees domain reorientation in a fully released film under these conditions was determined to be 32%. It was also found that the different clamping conditions strongly influence the amount of reorientation upon removing the applied field, with higher remanence of preferred domain orientations observed in declamped films. (C) 2015 AIP Publishing LLC.