Apollo 11 Lunar Samples: an Examination Using Tapping Mode Atomic Force Microscopy and Other Microscopic Methods
Apollo 11 Lunar Samples: an Examination Using Tapping Mode Atomic Force Microscopy and Other Microscopic Methods
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阿波罗 11 号月球样本：使用轻敲模式原子力显微镜和其他显微方法进行检查
DOI：
10.1007/0-306-47095-0_5
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发表时间：
2002
期刊：
影响因子：
--
通讯作者：
Sakina Ansari
中科院分区：
文献类型：
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作者：
E. Hammond;S. H. Cohen;J. Chavis;Sakina Ansari
我们使用轻敲模式下的原子力显微镜 (AFM)、扫描电子显微镜 (SEM)、能量色散 X 射线分析 (EDS) 和光学显微镜 (LM) 来研究阿波罗 11 号登月任务期间收集的岩石样本的形态特征。岩石中直径约为 460 埃的波浪状图案表明快速冷却，这可能是在月球形成期间发生的一些灾难性事件之后发生的。微观信息可用于建立数据库，以便对这些岩石和其他岩石的表面形态进行比较。
We used atomic force microscopy (AFM) in the tapping mode, scanning electron microscopy (SEM), energy dispersive x-ray analysis (EDS) and light microscopy (LM) to study the morphological features of a rock sample collected during the Apollo 11 mission to the moon. Wavelike patterns in the rocks measuring approximately 460 Å across are indicative of rapid cooling, which probably took place following some catastrophic event during the formation of the moon. Microscopic information can be used to establish a database so that comparisons between surface morphologies of these and other rocks can be made.