Micron-scale 3D imaging of wood and plant microstructure using high-resolution X-ray phase-contrast microtomography
Micron-scale 3D imaging of wood and plant microstructure using high-resolution X-ray phase-contrast microtomography
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DOI：
10.1016/j.jsb.2010.04.001
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发表时间：
2010-08-01
影响因子：
3
通讯作者：
Evans, R.
中科院分区：
文献类型：
--
作者：
Mayo, S. C.;Chen, F.;Evans, R.
木材在一系列长度尺度上的结构对这种工业上重要的天然材料的性能和特性至关重要。许多木材的分析在微米级以上是在二维使用光学显微镜进行。然而，近年来，使用X射线显微断层扫描的三维（3D）分析已被证明是越来越感兴趣的，提供体积数据，而没有物理切片损坏的风险。在目前的工作中，我们探索的潜力，实验室为基础的相衬X射线显微层析成像分析木材微观结构的微米级。通过使用相位对比度增强质量的3D数据集，已经获得了一些不同的木材标本。分割的数据集，然后进行不同类型的定量分析也成功地证明，确认该技术的价值，高分辨率分析的3D木材微观结构。皇冠版权所有（C）2010由爱思唯尔公司出版。All rights reserved.
The structure of wood on a range of length-scales is critical to the performance and properties of this industrially important natural material. Much analysis of wood on the micron-scale upwards is carried out in two dimensions using optical microscopy. In recent years, however, three-dimensional (3D) analysis using X-ray microtomography has proved to be of increasing interest, providing volumetric data without the risk of damage from physical sectioning. In the present work we explore the potential of laboratory-based phase-contrast X-ray microtomography for analysis of wood microstructure on the micron scale. 3D datasets with quality enhanced by the use of phase-contrast, have been obtained for a number of different wood specimens. Segmentation of the datasets followed by different types of quantitative analysis is also successfully demonstrated, confirming the value of this technique for high-resolution analysis of 3D wood microstructure. Crown Copyright (C) 2010 Published by Elsevier Inc. All rights reserved.