A 14-nm 0.14-psrms Fractional-N Digital PLL With a 0.2-ps Resolution ADC-Assisted Coarse/Fine-Conversion Chopping TDC and TDC Nonlinearity Calibration
A 14-nm 0.14-psrms Fractional-N Digital PLL With a 0.2-ps Resolution ADC-Assisted Coarse/Fine-Conversion Chopping TDC and TDC Nonlinearity Calibration
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DOI:
10.1109/jssc.2017.2742518
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发表时间:
2017-12-01
影响因子:
5.4
通讯作者:
Cho, Thomas Byunghak
中科院分区:
文献类型:
--
作者:
Yao, Chih-Wei;Ni, Ronghua;Cho, Thomas Byunghak
A digital fractional-N phase-locked loop (PLL) is presented. It achieves 137- and 142-fs rms jitter integrating from 10 kHz to 10 MHz and from 1 kHz to 10 MHz, respectively. With a frequency multiplication ratio of 207.0019231 [digitally controlled oscillator (DCO) frequency is 50 kHz away from an integer multiple of the 26-MHz reference clock], a -78.6-dBc fractional spur is achieved for an output clock that runs at half of the DCO frequency. Time-to-digital converter (TDC) chopping technique, TDC fine conversion through successive approximation register analog-to-digital converters (SARADCs), and TDC nonlinearity calibration improve integrated phase noise and fractional spurs. This design meets the performance requirement of the 256-QAM 4 x 4 MIMO LTE standard in 5-GHz ISM band and also the 5G cellular 64-QAM standard in 28-GHz band. This work, implemented in a 14-nm fin-shaped field effect transistor (FinFET) CMOS process, is integrated to a cellular RF integrated circuit supporting advanced carrier aggregation operation. This PLL draws 13.4 mW and occupies 0.257 mm(2).