Ionization Profile Monitor Simulations - Status and Future Plans
Ionization Profile Monitor Simulations - Status and Future Plans
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DOI：
10.18429/jacow-ibic2016-tupg71
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发表时间：
2017-02
期刊：
影响因子：
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通讯作者：
M. Sapinski;F. Belloni;B. Dehning;P. Forck;T. Giacomini;J. Marroncle;K. Satou;Rahul Singh;
中科院分区：
文献类型：
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作者：
M. Sapinski;F. Belloni;B. Dehning;P. Forck;T. Giacomini;J. Marroncle;K. Satou;Rahul Singh;
引出场的不均匀、电离过程中电子的速度分布和强束场只是影响电离分布监测器测量和操作的几个影响因素。对这些现象的仔细分析需要专门的模拟程序。近年来，不同的研究人员独立编写了几个这样的代码，这表明了对这类研究的重要需求。在这篇文章中，我们描述了可用的程序，并讨论了各种电离剖面监视器模拟的方法。我们提出了基准条件来比较这些代码之间的关系，并从各种设备收集数据来比较代码的测量结果。最后，我们提出了一个社区工作，目标是讨论代码，交换模拟结果，并开发和维护一个新的、通用的代码库。
Nonuniformities of the extraction fields, the velocity distribution of electrons from ionization processes and strong bunch fields are just a few of the effects affecting Ionization Profile Monitor measurements and operation. Careful analysis of these phenomena require specialized simulation programs. A handful of such codes have been written independently by various researchers over the recent years, showing an important demand for this type of study. In this paper we describe the available codes and discuss various approaches to Ionization Profile Monitor simulations. We propose benchmark conditions to compare these codes among each other and we collect data from various devices to benchmark codes against the measurements. Finally we present a community effort with a goal to discuss the codes, exchange simulation results and to develop and maintain a new, common codebase.