Broadband Scanning Microwave Microscopy investigation of graphene
Broadband Scanning Microwave Microscopy investigation of graphene
复制标题
石墨烯的宽带扫描微波显微镜研究
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
M. Farina
中科院分区：
文献类型：
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作者：
Silvia Fabiani;D. Mencarelli;A. di Donato;T. Monti;G. Venanzoni;A. Morini;T. Rozzi;M. Farina
在这项工作中，我们描述了应用程序的双通道扫描探针显微镜同时进行扫描隧道显微镜（STM）和宽带近场扫描微波显微镜（宽带SMM）-由我们自己开发-石墨烯片。在我们的系统中，我们引入了一个转换在时域来区分所需的信息，实现高质量的微波图像与纳米分辨率。石墨烯样品沉积在SiO2衬底上，并额外沉积金（接触指）。初步的测量似乎显示了薄片边缘附近阻抗局部变化的证据。
In this work we describe the application of a dual-channel scanning probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) - developed by ourselves- to a graphene flake. In our system we introduce a conversion in Time-Domain to discriminate the desired information, achieving high quality microwave images with nanometric resolution. The graphene sample is deposited on a substrate of SiO2 with an additional deposition of gold (a contact finger). The preliminary measurements seem to show evidence of localized change of impedance near the edge of the flake.