A new charge pump without degradation in threshold voltage due to body effect [memory applications]
A new charge pump without degradation in threshold voltage due to body effect [memory applications]
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DOI:
10.1109/4.859515
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发表时间:
2000-08
影响因子:
5.4
通讯作者:
Jongshin Shin;I. Chung;Y. Park;H. Min
中科院分区:
文献类型:
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作者:
Jongshin Shin;I. Chung;Y. Park;H. Min
A new charge-pump circuit with the controllable body voltage is proposed. By adjusting the body voltage, the back bias effect is removed and the threshold voltage of the MOSFET used as a switch is kept constant. With no threshold voltage increase, higher output voltage than the conventional charge pump can be obtained in the proposed charge pump. With two auxiliary MOSFETs used to update the body voltage, the proposed charge pump shows compatible performance of the ideal diode charge pump.