Bit density dependence of thermal relaxation in perpendicular magnetic recording
Bit density dependence of thermal relaxation in perpendicular magnetic recording
复制标题
垂直磁记录中热弛豫的位密度依赖性
DOI：
10.3379/jmsjmag.21.293
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发表时间：
1997
影响因子：
--
通讯作者：
Y. Nakamura
中科院分区：
文献类型：
--
作者：
W. H. Jiang;H. Muraoka;I. Tagawa;Y. Nakamura
利用单极写入磁头和磁流变浮动磁头，对垂直双层介质中的热弛豫进行了模拟和实验研究。结合指数弛豫理论，提出了一种新的卷曲开关模型有限元模拟方法。模拟表明，在高密度比在低密度的弛豫少。在5 kFRPI下，在约105秒内，实际上仅通过实验确认了由于热弛豫引起的2%的输出劣化，并且在130 kFRPI下几乎没有劣化。与纵向记录相反，对于较高的线密度，观察到较少的输出减少;这可以很好地解释垂直磁记录中的退磁场的性质。
Thermal relaxation in perpendicular double-layered media was examined by simulation and experiments, using a single-pole writing head and an MR flying head. A new FEM simulation with a curling switching model is expanded in association with the exponential relaxation theory. The simulation indicates that the relaxation is less at high densities than at low densities. Only a 2% output deterioration due to thermal relaxation was actually confirmed experimentally for about 105 seconds at 5 kFRPI, and there was almost no deterioration at 130 kFRPI. In contrast to longitudinal recording, less output reduction is observed for higher linear densities; this is well explained by the nature of the demagnetization field in perpendicular magnetic recording.