A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping.
A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping.
复制标题
基于实验室的 Laue X 射线衍射系统,用于增强成像范围和表面颗粒映射。
DOI:
10.1107/s1600576715009097
复制
发表时间:
2015-08-01
影响因子:
6.1
通讯作者:
Huxley AD
中科院分区:
文献类型:
--
作者:
Whitley W;Stock C;Huxley AD
Apparatus is described for the purpose of automated grain mapping of polycrystalline samples within a laboratory environment, using a motorized sample stage and a CCD detector. The limitations that come from using a faster detector of relatively small surface are countered using an automated translation stage. Although CCD X-ray detectors can be faster to use, their large-area versions can be much more expensive than similarly sized photographic plate detectors. When indexing X-ray diffraction patterns, large-area detectors can prove very advantageous as they provide more spots, which makes fitting an orientation easier. On the other hand, when looking for single crystals in a polycrystalline sample, the speed of CCD detectors is more useful. A new setup is described here which overcomes some of the limitations of limited-range CCD detectors to make them more useful for indexing, whilst at the same time making it much quicker to find single crystals within a larger polycrystalline structure. This was done by combining a CCD detector with a six-axis goniometer, allowing the compilation of images from different angles into a wide-angled image. Automated scans along the sample were coupled with image processing techniques to produce grain maps, which can then be used to provide a strategy to extract single crystals from a polycrystal.