High-precision measurement and analysis of colloidal monolayers.
High-precision measurement and analysis of colloidal monolayers.
复制标题
胶体单层的高精度测量和分析。
DOI：
10.1021/ac902722d
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发表时间：
2010
影响因子：
7.4
通讯作者：
Chiu,DanielT
中科院分区：
文献类型：
--
作者：
Milne,Graham;Zhao,Yongxi;Chiu,DanielT
本技术说明描述了一种用于分析胶体单层的成像算法，包括以纳米级分辨率测量颗粒间距离，自动检测缺陷和边缘，以及确定胶体粒度分布的均匀性。该算法还允许自动检测和测量由非方形探测器像素引入的缩放，这是成像中的常见问题。作为一个应用程序，我们演示了使用这种方法的空间校准数字视频显微镜系统，可以应用在传统的方法可能是不合适的情况下。在这里，我们提供了算法工作的概述，我们已经免费提供。
This technical note describes an imaging algorithm for analyzing colloidal monolayers, including the measurement of particle-to-particle distances with nanometer-scale resolution and the automated detection of defects and edges, as well as determining the uniformity of the colloid size distribution. The algorithm also allows for the automatic detection and measurement of scaling introduced by nonsquare detector pixels, a common problem in imaging. As an application, we demonstrate the use of this method for spatially calibrating digital video microscopy systems that can be applied in situations where conventional methods may be inappropriate. Here, we provide an overview of the workings of the algorithm, which we have made freely available.