Growth and ferromagnetic resonance properties of nanometer-thick yttrium iron garnet films
Growth and ferromagnetic resonance properties of nanometer-thick yttrium iron garnet films
复制标题
DOI：
10.1063/1.4759039
复制
发表时间：
2012-10-08
影响因子：
4
通讯作者：
Hoffmann, Axel
中科院分区：
文献类型：
--
作者：
Sun, Yiyan;Song, Young-Yeal;Hoffmann, Axel
报道了纳米厚钇铁石榴石薄膜的生长和薄膜的铁磁共振（FMR）线宽特性。采用脉冲激光沉积（PLD）技术在钆镓石榴石衬底上生长薄膜。在5 ~ 35 nm厚度范围内，薄膜呈（111）取向，表面粗糙度在0.1 ~ 0.3 nm之间。10 nm薄膜显示10 GHz FMR线宽约为6 Oe，阻尼常数为3.2 x 10（-4）。FMR线宽随表面粗糙度和表面铁缺乏而增加。较厚的薄膜表现出较小的FMR线宽和较低的阻尼常数。(C) 2012年美国物理研究所。[http://dx.doi.org/10.1063/1.4759039]
Growth of nm-thick yttrium iron garnet films and ferromagnetic resonance (FMR) linewidth properties in the films are reported. The films were grown on gadolinium gallium garnet substrates by pulsed laser deposition (PLD). Films in the 5-35 nm thickness range showed a (111) orientation and a surface roughness between 0.1 and 0.3 nm. The 10 nm films showed a 10 GHz FMR linewidth of about 6 Oe and a damping constant of 3.2 x 10(-4). The FMR linewidth increases with both the surface roughness and the surface Fe deficiency. Thicker films exhibit a smaller FMR linewidth and a lower damping constant. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4759039]