Accounting for the JKR-DMT transition in adhesion and friction measurements with atomic force microscopy
Accounting for the JKR-DMT transition in adhesion and friction measurements with atomic force microscopy
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DOI：
10.1163/1568561054352685
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发表时间：
2005-01-01
影响因子：
2.3
通讯作者：
Carpick, RW
中科院分区：
文献类型：
--
作者：
Grierson, DS;Flater, EE;Carpick, RW
在过去的15年里，研究人员将连续接触力学理论应用于纳米摩擦学测量，以确定纳米级接触中的基本参数和过程。在本文中，我们讨论的工作，使用原子力显微镜，以确定纳米级的固体之间的粘附和摩擦性能。我们的重点是连续介质接触力学在分析这些测量中所起的作用。特别是，我们展示了如何考虑JKR到DMT过渡，以及使用这些模型的接触中存在的粘附力的限制。
Over the last 15 years, researchers have applied theories of continuum contact mechanics to nanotribology measurements to determine fundamental parameters and processes at play in nanometer-scale contacts. In this paper we discuss work using the atomic force microscope to determine nanoscale adhesion and friction properties between solids. Our focus is on the role that continuum contact mechanics plays in analyzing these measurements. In particular, we show how the JKR-to-DMT transition is taken into account, as well as limitations involved in using these models of contact in the presence of adhesion.