Design And Performance Of An X‐ray Undulator Beamline PF‐AR‐NW2
Design And Performance Of An X‐ray Undulator Beamline PF‐AR‐NW2
复制标题
X射线波荡器光束线PF-AR-NW2的设计与性能
DOI:
10.1063/1.1757782
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发表时间:
2004
期刊:
影响因子:
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通讯作者:
H. Kawata
中科院分区:
文献类型:
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作者:
Takashi Mori;M. Nomura;M. Sato;H. Adachi;Y. Uchida;A. Toyoshima;S. Yamamoto;K. Tsuchiya;T. Shioya;H. Kawata
An X‐ray undulator beamline PF‐AR‐NW2, which is used for time‐resolved XAFS and/or x‐ray diffraction experiments and also high‐flux XAFS and/or diffraction experiments, has been designed and constructed. The insertion device is an in‐vacuum undulator at a period of 40 mm, and the number of periods is 90 in order to cover an energy range of 5 ∼ 25 keV. Main optical components are a double‐crystal monochromator and a mirror system. The double‐crystal monochromator consists of flat Si (111) crystals, which are cooled by liquid nitrogen. The mirror system consists of focusing and cut‐off mirror systems. The commissioning has been done successfully. The focused beam size with a bent cylindrical mirror is about 0.21 mm × 0.55 mm for vertically and horizontally with the intensity of 6.4 × 1012 photons/s at 12.4 keV. The vertical beam size focused with a bent flat mirror is about 0.06 mm. We compare the performance with the values from a ray‐tracing calculation.