3-D Simulations and Design of Multistage Depressed Collectors for Sheet Beam Millimeter Wave Vacuum Electron Devices
3-D Simulations and Design of Multistage Depressed Collectors for Sheet Beam Millimeter Wave Vacuum Electron Devices
复制标题
片束毫米波真空电子器件多级凹陷集电极的 3D 仿真与设计
DOI：
10.1109/ted.2013.2272602
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发表时间：
2013-08
期刊：
影响因子：
--
通讯作者：
Luhmann, N.C.
中科院分区：
文献类型：
--
作者：
Zongjun Shi;Gamzina, D.;Barnett, L.R.;Baig, A.;Luhmann, N.C.
从微波到太赫兹，基于片状电子束的真空电子器件受到了越来越多的关注。与标准的铅笔束装置一样，希望通过使用多级凹陷收集器来提高总体净效率。然而，由于电子束的椭圆截面，薄片电子束给这项任务带来了独特的挑战。本文重点研究了从束波相互作用区到所设计的能量回收结构，即多级凹陷集电极的交流调制薄束拓扑结构的电子束动力学的三维模拟。为了说明这一点，本文用三维电磁粒子池(PIC)时域有限差分程序MAGIC对W波段薄束速调管五级凹陷集电极进行了设计和分析。为了确定最佳的操作参数，进行了大量的PIC模拟。研究了二次电子对回收效率和电子回流的影响。为了适应板梁的椭圆形横截面，还探索了增加类似跑道的结构来减少回流的方案。通过优化，获得了88.38%的回收效率，最小总电子回流分数为0.25%。
There is an increasing interest in sheet electron beam-based vacuum electron devices from the microwave through terahertz region. As with standard pencil beam devices, it is desirable to increase overall net efficiency through the use of multistage depressed collectors. The sheet electron beam, however, brings unique challenges to this task due to the elliptical cross section of the beam. This paper focuses on the comprehensive 3-D simulation modeling of the electron beam dynamics for the ac modulated sheet beam topology from the beam-wave interaction region up to the designed energy recovery structure, i.e., the multistage depressed collector. For purposes of illustration, the design and analysis of a five-stage depressed collector for a W-band sheet beam klystron using the 3-D electromagnetic particle-in-cell (PIC) finite difference time domain code MAGIC is described herein. Numerous PIC simulations were carried out to determine the optimum operating parameters. The effects of the secondary electrons on the recovery efficiency and the electron back streaming were both investigated. To accommodate the elliptical cross section of the sheet beam, the option of adding a racetrack-like structure to decrease the back streaming was also explored. Through optimization, a recovery efficiency of 88.38% was achieved, with a minimized total electron back-streaming fraction of 0.25%.
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影响因子：
3.2
作者：
M. Basten;J. Booske
通讯作者：
M. Basten;J. Booske
DOI：
10.1109/ivelec.2007.4283281
发表时间：
2007-05
期刊：
2007 IEEE International Vacuum Electronics Conference
影响因子：
--
作者：
G. Scheitrum;G. Caryotakis;A. Jensen;A. Burke;A. Haase;E. Jongewaard;M. Neubauer;B. Steele
通讯作者：
G. Scheitrum;G. Caryotakis;A. Jensen;A. Burke;A. Haase;E. Jongewaard;M. Neubauer;B. Steele
影响因子：
3.1
作者：
Y. Shin;Jian-xun Wang;L. Barnett;N. Luhmann
通讯作者：
Y. Shin;Jian-xun Wang;L. Barnett;N. Luhmann
影响因子：
1.5
作者：
Carlsten, BE;Russell, SJ;Humphries, S
通讯作者：
Humphries, S
DOI：
--
发表时间：
2011-04
期刊：
2011 China-Japan Joint Microwave Conference
影响因子：
--
作者：
J. Lai;Y. Gong;Yanyu Wei;Xiong Xu;Wenxiang Wang
通讯作者：
J. Lai;Y. Gong;Yanyu Wei;Xiong Xu;Wenxiang Wang