Friction traced to the single atom
Friction traced to the single atom
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DOI：
10.1073/pnas.182160599
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发表时间：
2002-09-17
影响因子：
11.1
通讯作者：
Mannhart, J
中科院分区：
文献类型：
--
作者：
Giessibl, FJ;Herz, M;Mannhart, J
摩擦是由宏观物体之间的耗散横向力引起的。因此，通过测量作用在单个原子之间的耗散横向力，可以更好地理解摩擦。在这里，我们建立了保守和耗散力的横向力显微镜的原子分辨率，提出了原子缺陷的分辨率。测量了平行于Si（111）-（7 × 7）表面振荡的单尖原子之间的相互作用。发现每个振荡周期的耗散能高达4 eV，用G. A. 1929年的汤姆林森
Friction is caused by dissipative lateral forces that act between macroscopic objects. An improved understanding of friction is therefore expected from measurements of dissipative lateral forces acting between individual atoms. Here we establish atomic resolution of both conservative and dissipative forces by lateral force microscopy, presenting the resolution of atomic defects. The interaction between a single-tip atom that is oscillated parallel to an Si(111)-(7 x 7) surface is measured. A dissipation energy of up to 4 eV per oscillation cycle is found. The dissipation is explained by a "plucking action of one atom on to the other" as described by G. A. Tomlinson in 1929.