On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test And Its Application to A Digital Sensor
On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test And Its Application to A Digital Sensor
复制标题
耐老化环形振荡器加速寿命评价及其在数字传感器中的应用
DOI：
10.1109/ats49688.2020.9301588
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发表时间：
2020
期刊：
影响因子：
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通讯作者：
Seiji Kajihara
中科院分区：
文献类型：
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作者：
Masayuki Gondo;Yousuke Miyake;Takaaki Kato;Seiji Kajihara
提出了一种用于数字式温度电压传感器的耐老化环形振荡器（RO）。本文通过65纳米CMOS技术测试芯片的加速寿命试验，探讨了活性氧耐老化的有效性。研究了传感器时延退化的进展，研究了时延退化对传感器测量精度的影响。实验结果表明，抗老化ROs可以减轻延迟退化，降低传感器的测量误差。与不耐老化RO组成的传感器相比，温度和电压误差分别降低2.5°C和32mV。
An aging-tolerant ring oscillator (RO) has been proposed for a digital temperature and voltage sensor. This paper discusses on the effectiveness of aging-tolerance of the ROs through accelerated life test for a test chip with 65nm CMOS technology. The progress of delay degradation of the ROs is examined, and influence of delay degradation on measurement accuracy of the sensor is investigated. Experimental results show that the aging-tolerant ROs can mitigate delay degradation, and that the measurement errors of the sensor can be reduced. Compared with a sensor consisting of an aging-intolerant RO, temperature and voltage errors are reduced 2.5°C and 32mV, respectively.