New epitaxial phase transition between DG and HEX in PS-b-PI.
New epitaxial phase transition between DG and HEX in PS-b-PI.
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DOI：
10.1021/ja808259m
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发表时间：
2009-01
影响因子：
15
通讯作者：
Hae-woong Park;Jueun Jung;T. Chang;Kazuyuki Matsunaga;H. Jinnai
中科院分区：
文献类型：
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作者：
Hae-woong Park;Jueun Jung;T. Chang;Kazuyuki Matsunaga;H. Jinnai
研究了聚苯乙烯-b-聚异戊二烯嵌段共聚物在硅衬底上的薄膜从双螺旋（DG）到六方填充圆柱（HEX）相的外延相变。薄膜的内部结构进行了研究，掠入射小角X射线散射，透射电子显微镜，透射电子显微断层扫描（TEMT）。TEMT允许直接观察共存DG和HEX的3D图像。薄膜中良好的畴取向和直接三维成像的TEMT可以观察到DG和HEX的共存相，并发现了一个新的从DG到HEX的外延过渡路径。
We investigated the epitaxial phase transition from double gyroid (DG) to hexagonally packed cylinder (HEX) phases of a polystyrene-b-polyisoprene diblock copolymer in a thin film on a Si wafer substrate. The internal structure of the thin film was investigated by grazing incidence small-angle X-ray scattering, transmission electron microscopy, and transmission electron microtomography (TEMT). TEMT allows observation of the 3D-image of coexisting DG and HEX directly. Good domain orientation in the thin film and direct 3D-imaging of TEMT made it possible to observe the coexisting phase of DG and HEX, and a new epitaxial transition path from DG to HEX was found.