A scanning microscope employing localized surface-plasmon-polaritons as a sensing probe
A scanning microscope employing localized surface-plasmon-polaritons as a sensing probe
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DOI:
10.1016/s0030-4018(00)00794-x
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发表时间:
2000-08-01
影响因子:
2.4
通讯作者:
Knoll, W
中科院分区:
文献类型:
--
作者:
Kano, H;Knoll, W
We report on a microscopic technique employing locally excited surface-plasmon-polaritons (SPPs) as the sensing probe. The localized SPPs are excited by a focused laser beam on a metallic surface and the Fourier spectrum of the reflected Light is observed in order to measure the propagation constant of the excited SPPs. By using the well-known relationship between the propagation constant of SPP and the refractive-index of a sample deposited onto the metal surface, we determine the local refractive-index. We develop a sample scanning microscope based on this concept and observe dispersed micro-particles on a silver surface. Our experimental results show 1.5 mu m or better resolution, which has been not achieved before. (C) 2000 Published by Elsevier Science B.V.