Domain wall motion across microstructural features in polycrystalline ferroelectric films
Domain wall motion across microstructural features in polycrystalline ferroelectric films
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多晶铁电薄膜中微结构特征的畴壁运动
DOI:
10.1016/j.actamat.2023.118871
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发表时间:
2023
期刊:
影响因子:
9.4
通讯作者:
Trolier-McKinstry, Susan
中科院分区:
文献类型:
--
作者:
Hennessey, Gavin;Peters, Travis;Tipsawat, Pannawit;Checa, Marti;Collins, Liam;Trolier-McKinstry, Susan
This paper describes the effect of microstructural features such as grain boundaries and triple points on the pinning of domain wall motion in perovskite Pb(Zr0.52Ti0.48)O3(PZT) films on polycrystalline SrRuO3/SrTiO3substrates. Spatial variability in the collective domain wall dynamics was assessed using non-linearity mapping via Band Excitation Piezoresponse Force Microscopy (BE-PFM). Collocating the non-linearity maps with triple point locations (as visualized by EBSD) allowed for exploration of the effects that local microstructure (e.g., grain boundary) have on domain wall motion. It was found that the extrinsic behavior varied with both the misorientation angle and the proximity to the grain boundary. The width of influence of individual grain boundaries on the motion of domain walls was a function of the character of the grain boundary; random grain boundaries exhibit deeper minima in αd/d33,initialand larger widths of influence (up to 905 nm) compared to coincident site lattice (CSL) boundaries (up to 572 nm). Additionally, triple points containing larger numbers of random boundaries exhibited non-Rayleigh behavior to greater distances, suggesting that the triple point provides either a deep potential minimum or a region where domain wall motion is unfavorable.