Imaging magnetic structures with a transmission X-ray microscope
Imaging magnetic structures with a transmission X-ray microscope
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使用透射 X 射线显微镜对磁性结构进行成像
DOI：
10.1063/1.1291144
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发表时间：
2000
期刊：
影响因子：
--
通讯作者：
G. Bayreuther
中科院分区：
文献类型：
--
作者：
P. Fischer;T. Eimuller;G. Schütz;P. Guttmann;G. Schmahl;G. Bayreuther
X射线磁性圆二色性（X-MCD），即，圆偏振X射线的吸收对吸收体的磁化强度的依赖性在过渡金属的L边缘处表现出高达25%的值。这可以用作与透射X射线显微镜（TXM）组合的巨大磁对比机制，以提供低至约30 nm的横向分辨率的磁畴成像。固有的元件特异性、在完整的磁滞回线内在变化的外部场中记录图像的可能性、对比度与局部磁自旋和轨道矩的关系等证明了在当前技术相关系统（如用于高密度存储介质的磁光、用于GMR应用的多层或用于MRAM技术的纳米结构）中研究磁畴结构的独特适用性。
The X-ray magnetic circular dichroism (X-MCD), i.e., the dependence of the absorption of circularly polarized X-rays on the magnetization of the absorber exhibits at L-edges of transition metals values up to 25%. This can serve as a huge magnetic contrast mechanism in combination with a transmission X-ray microscope (TXM) to image magnetic domains providing a lateral resolution down to about 30 nm. The inherent element-specificity, the possibility to record images in varying external fields within a complete hysteresis loop, the relation of the contrast to local magnetic spin and orbital moments, etc. demonstrate the unique applicability to study the magnetic domain structure in current technical relevant systems like magneto-optics for high density storage media, multilayers for GMR applications or nanostructures for MRAM technology.