Development of the analog ASIC for multi-channel readout X-ray CCD camera

Development of the analog ASIC for multi-channel readout X-ray CCD camera
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DOI:
10.1016/j.nima.2010.12.174
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发表时间:
2011-02
影响因子:
1.4
通讯作者:
H. Nakajima;D. Matsuura;T. Idehara;N. Anabuki;H. Tsunemi;J. Doty;H. Ikeda;H. Katayama;H. Kitamura;Y. Uchihori
H. Nakajima;D. Matsuura;T. Idehara;N. Anabuki;H. Tsunemi;J. Doty;H. Ikeda;H. Katayama;H. Kitamura;Y. Uchihori
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
H. Nakajima;D. Matsuura;T. Idehara;N. Anabuki;H. Tsunemi;J. Doty;H. Ikeda;H. Katayama;H. Kitamura;Y. Uchihori

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我们报告了针对下一颗 X 射线天文卫星 ASTRO-H 上的 X 射线 CCD 相机系统的前端电子器件而开发的模拟专用集成电路 (ASIC) 的性能。它有四个相同的通道,可同时处理 CCD 信号。独特的模数转换能力使我们能够构建仅输出数字信号的 CCD 相机机身。前端电子测试结果表明,在低于100kHz的像素速率下,它可以正常工作,输入噪声≤30μV。功耗足够低,约为 150mW/芯片。 ±20mV的输入信号范围覆盖了典型X射线光子计数CCD的有效能量范围(高达20keV)。积分非线性为0.2%,与在轨常规CCD相似。我们还针对总电离剂量 (TID) 效应和单粒子效应进行了辐射耐受性测试。使用60Co和质子束的辐照测试表明,ASIC具有足够的耐受高达200krad的TID,这绝对超出了低倾角近地轨道运行期间的预期剂量量。 Fe离子的注量为5.2×108Ion/cm2的辐照没有导致单粒子闩锁(SEL),尽管可能存在一些单粒子扰动。 SEL 的阈值高于 1.68MeVcm2/mg,这足够高,SEL 事件不应成为仪器在轨停机的主要原因之一。
We report on the performance of an analog application-specific integrated circuit (ASIC) developed aiming for the front-end electronics of the X-ray CCD camera system onboard the next X-ray astronomical satellite, ASTRO-H. It has four identical channels that simultaneously process the CCD signals. Distinctive capability of analog-to-digital conversion enables us to construct a CCD camera body that outputs only digital signals. As the result of the front-end electronics test, it works properly with low input noise of ≤30μV at the pixel rate below 100kHz. The power consumption is sufficiently low of ∼150mW/chip. The input signal range of ±20mV covers the effective energy range of the typical X-ray photon counting CCD (up to 20keV). The integrated non-linearity is 0.2% that is similar as those of the conventional CCDs in orbit. We also performed a radiation tolerance test against the total ionizing dose (TID) effect and the single event effect. The irradiation test using60Co and proton beam showed that the ASIC has the sufficient tolerance against TID up to 200krad, which absolutely exceeds the expected amount of dose during the period of operating in a low-inclination low-earth orbit. The irradiation of Fe ions with the fluence of 5.2×108Ion/cm2resulted in no single event latchup (SEL), although there were some possible single event upsets. The threshold against SEL is higher than 1.68MeVcm2/mg, which is sufficiently high enough that the SEL event should not be one of major causes of instrument downtime in orbit.