Accuracy and precision of near-field high-energy diffraction microscopy forward-model-based microstructure reconstructions
Accuracy and precision of near-field high-energy diffraction microscopy forward-model-based microstructure reconstructions
复制标题
基于近场高能衍射显微镜正向模型的微观结构重建的准确性和精密度
DOI：
10.1107/s1600576719016005
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发表时间：
2020
影响因子：
6.1
通讯作者：
R. Suter
中科院分区：
文献类型：
--
作者：
David B. Menasche;P. Shade;R. Suter
近场高能衍射显微镜（nf-HEDM）技术的准确性进行评估，通过直接比较nf-HEDM重建的微结构与电子背散射衍射（EBSD）表征相同的微结构。选择高纯度的金寡晶进行表征，以便于每种技术所给出的重建之间的直接一对一比较。通过使用EBSD重建的相对高的空间分辨率作为晶界网络形态的基础事实，确定了nf-HEDM以平均优于所使用的成像探测器的分辨率或重建体素尺寸内的精度（以较大者为准）定位内部晶界。通过将有序晶粒中的晶内取向差作为取向分辨率的代表，确定标准数据收集程序确定的晶体取向优于0.1°。各种修改后的数据收集程序的影响也进行了研究。
The accuracy of the near-field high-energy diffraction microscopy (nf-HEDM) technique is evaluated by directly comparing an nf-HEDM reconstructed microstructure with an electron backscatter diffraction (EBSD) characterization of the same microstructure. A high-purity gold oligocrystal was chosen for characterization in order to facilitate direct one-to-one comparison between the reconstructions given by each technique. By using the comparatively high spatial resolution of the EBSD reconstruction as the ground truth for the grain-boundary network's morphology, it is determined that nf-HEDM locates internal grain boundaries with an accuracy on average better than the resolution of the imaging detector used or within the reconstruction voxel size, whichever is larger. By taking the intragranular misorientation in well ordered grains as a proxy for orientation resolution, it is determined that standard data collection procedures determine crystallographic orientations to better than 0.1°. The effects of various modified data collection procedures are also examined.