Morphological operation-based bi-dimensional empirical mode decomposition for automatic background removal of fringe patterns

Morphological operation-based bi-dimensional empirical mode decomposition for automatic background removal of fringe patterns
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基于形态学运算的二维经验模态分解自动去除条纹图案背景

DOI:
10.1364/oe.20.024247
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发表时间:
2012-10-22
期刊:
影响因子:
3.8
通讯作者:
Zhao, Hong
Zhao, Hong
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Zhou, Xiang;Podoleanu, Adrian Gh.;Zhao, Hong

文献摘要

被引文献

相似文献

提出了一种改进的二维经验模态分解(BEMD)方法,用于将条纹图案稀疏地分解为两个分量,即单个本征模态函数(IMF)和残差。该方法的主要思想是改进的筛选过程,利用形态学运算来检测条纹的脊和谷,并使用加权移动平均算法来估计IMF的包络,取代了传统BEMD的各自的局部极值检测和包络插值。通过提取单个IMF,自动去除条纹图案的背景强度,从而缓解BEMD的模式混合问题。还提出了一种基于二维卷积的快速算法,将计算时间减少到几秒钟。该方法应用于处理模拟和真实条纹图案,并将所得结果与傅里叶变换、离散小波变换和其他EMD方法进行比较。 MATLAB 代码可从 http://gr.xjtu.edu.cn/web/zhoufang 下载。 (C) 2012年美国光学学会
A modified bi-dimensional empirical mode decomposition (BEMD) method is proposed for sparsely decomposing a fringe pattern into two components, namely, a single intrinsic mode function (IMF) and a residue. The main idea of this method is a modified sifting process which employs morphological operations to detect ridges and troughs of the fringes, and uses weighted moving average algorithm to estimate envelopes of the IMF, replacing respective local extrema detection and envelope interpolation of conventional BEMDs. The background intensity of the fringe pattern is automatically removed by extracting the single IMF, thereby relieving the mode mixing problem of the BEMDs. A fast algorithm based on 2D convolution is also presented for reducing the calculation time to several seconds only. This approach is applied to process simulated and real fringe patterns, and the results obtained are compared with Fourier transform, discrete wavelet transform, and other EMD methods. The MATLAB code is downloadable at http://gr.xjtu.edu.cn/web/zhouxiang. (C) 2012 Optical Society of America