Angstrom-beam electron diffraction of amorphous materials
Angstrom-beam electron diffraction of amorphous materials
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DOI：
10.1016/j.jnoncrysol.2013.03.010
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发表时间：
2014-01-01
影响因子：
3.5
通讯作者：
Chen, Mingwei
中科院分区：
文献类型：
--
作者：
Hirata, Akihiko;Chen, Mingwei
我们已经开发了一种用于非晶材料结构表征的埃束电子衍射（ABED）技术，使用最先进的球面像差校正扫描透射电子显微镜。聚焦电子束的直径约为0.4 nm，相当于玻璃中短程有序的大小，使我们能够直接检测衍射模式中无序材料的局部原子结构。本文简要介绍了ABED的基本原理及其在金属玻璃和氧化物玻璃结构表征中的初步应用。讨论了样品厚度的影响以及利用原子束电子衍射研究玻璃材料中程有序的方法。(C)2013爱思唯尔有限公司版权所有。
We have developed an Angstrom-beam electron diffraction (ABED) technique for structure characterization of amorphous materials using a state-the-of-art spherical aberration-corrected scanning transmission electron microscope. The focused electron beam with a diameter of similar to 0.4 nm, comparable to the size of short range order in glasses, enables us to directly detect local atomic structure of disordered materials in a diffraction mode. In this paper we briefly introduce the basic principle of ABED and preliminary applications in structural characterization of metallic glasses and oxide glasses. We also discuss the effect of sample thickness and the method to study medium range order of glassy materials using ABED. (C) 2013 Elsevier B.V. All rights reserved.